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"Effect of Frequency on Reliability Of High-K MIM Capacitors."

X. Federspiel et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117790

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/FederspielGBL23
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  - https://dblp.org/rec/conf/irps/FederspielGBL23
X. Federspiel, A. Griffon, M. Barlas, P. Lamontagne:
Effect of Frequency on Reliability Of High-K MIM Capacitors. IRPS 2023: 1-6

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