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"Advances in Artefact Quality Analysis for Safety-Critical Systems."

Eugenio Parra et al. (2019)

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DOI: 10.1109/ISSREW.2019.00047

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-21

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  dblp key:
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Eugenio Parra, Luis Alonso, Roy Mendieta, Jose Luis de la Vara:
Advances in Artefact Quality Analysis for Safety-Critical Systems. ISSRE Workshops 2019: 79-84

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