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"Studying the Impact of Gate Tunneling on Dynamic Behaviors of ..."

Pin Su et al. (2002)

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DOI: 10.1109/ISQED.2002.996792

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/isqed/SuFLH02
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  - https://dblp.org/rec/conf/isqed/SuFLH02
Pin Su, Samel K. H. Fung, Weidong Liu, Chenming Hu:
Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD. ISQED 2002: 487-491

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