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"A Methodology for Chip-Level Electromigration Risk Assessment and Product ..."

Chanhee Oh et al. (2004)

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DOI: 10.1109/ISQED.2004.1283679

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/isqed/OhHGGZKP04
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  - https://dblp.org/rec/conf/isqed/OhHGGZKP04
Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda:
A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. ISQED 2004: 232-237

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