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"Optimal wiring topology for electromigration avoidance considering ..."

Iris Hui-Ru Jiang, Hua-Yu Chang, Chih-Long Chang (2010)

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DOI: 10.1145/1735023.1735064

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Iris Hui-Ru Jiang, Hua-Yu Chang, Chih-Long Chang:
Optimal wiring topology for electromigration avoidance considering multiple layers and obstacles. ISPD 2010: 177-184

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