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"Efficiently decodable defective items detected by new model of noisy group ..."

Thach V. Bui, Tetsuya Kojima, Isao Echizen (2016)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-11

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  dblp key:
  - conf/isita/BuiKE16
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  - https://dblp.org/rec/conf/isita/BuiKE16
Thach V. Bui, Tetsuya Kojima, Isao Echizen:
Efficiently decodable defective items detected by new model of noisy group testing. ISITA 2016: 265-269

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