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"Characterization of Transistor Mismatch for Statistical CAD of Submicron ..."

Christopher J. Abel et al. (1993)

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type: Conference or Workshop Paper

metadata version: 2020-11-24

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  dblp key:
  - conf/iscas/AbelMITL93
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  - https://dblp.org/rec/conf/iscas/AbelMITL93
Christopher J. Abel, Christopher Michael, Mohammed Ismail, C. S. Teng, R. Lahrio:
Characterization of Transistor Mismatch for Statistical CAD of Submicron CMOS Analog Circuits. ISCAS 1993: 1401-1404

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