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"Reduced complexity test generation algorithms for transition fault diagnosis."

Yu Zhang, Vishwani D. Agrawal (2011)

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DOI: 10.1109/ICCD.2011.6081382

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/iccd/ZhangA11
Yu Zhang, Vishwani D. Agrawal:
Reduced complexity test generation algorithms for transition fault diagnosis. ICCD 2011: 96-101

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