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"A statistical critical path monitor in 14nm CMOS."

Bruce M. Fleischer et al. (2016)

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DOI: 10.1109/ICCD.2016.7753334

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/iccd/FleischerVBJ16
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  - https://dblp.org/rec/conf/iccd/FleischerVBJ16
Bruce M. Fleischer, Christos Vezyrtzis, Karthik Balakrishnan, Keith A. Jenkins:
A statistical critical path monitor in 14nm CMOS. ICCD 2016: 507-511

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