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"An Area-Efficient Scannable In Situ Timing Error Detection Technique ..."

Hao Zhang et al. (2021)

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DOI: 10.1109/ICCAD51958.2021.9643525

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-28

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  dblp key:
  - conf/iccad/ZhangH0S21
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  - https://dblp.org/rec/conf/iccad/ZhangH0S21
Hao Zhang, Weifeng He, Yanan Sun, Mingoo Seok:
An Area-Efficient Scannable In Situ Timing Error Detection Technique Featuring Low Test Overhead for Resilient Circuits. ICCAD 2021: 1-9

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