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"Metrology for analog module testing using analog testability bus."

Chauchin Su et al. (1996)

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DOI: 10.1109/ICCAD.1996.569916

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/SuCJT96
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/SuCJT96
Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou, Yuan-Tzu Ting:
Metrology for analog module testing using analog testability bus. ICCAD 1996: 594-599

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