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"Built-in test generation for synchronous sequential circuits."

Irith Pomeranz, Sudhakar M. Reddy (1997)

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DOI: 10.1109/ICCAD.1997.643570

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/iccad/PomeranzR97
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/PomeranzR97
Irith Pomeranz, Sudhakar M. Reddy:
Built-in test generation for synchronous sequential circuits. ICCAD 1997: 421-426

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