default search action

combined dblp search
author search
venue search
publication search

ask others

"Variability evaluation of feedback circuits used in nanoelectronic ..."

Arne Heittmann, Tobias G. Noll (2013)

> Home

Details and statistics

DOI: 10.1145/2483028.2483078

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/glvlsi/HeittmannN13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/HeittmannN13
Arne Heittmann, Tobias G. Noll:
Variability evaluation of feedback circuits used in nanoelectronic Memristive/CMOS circuits. ACM Great Lakes Symposium on VLSI 2013: 137-142

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.