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"Scan chain encryption for the test, diagnosis and debug of secure circuits."

Mathieu Da Silva et al. (2017)

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DOI: 10.1109/ETS.2017.7968248

access: closed

type: Conference or Workshop Paper

metadata version: 2017-07-13

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  - conf/ets/SilvaFNRPR17
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Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo:
Scan chain encryption for the test, diagnosis and debug of secure circuits. ETS 2017: 1-6

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