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"A Dynamic Greedy Test Scheduler for Optimizing Probe Motion in In-Circuit ..."

Luciano Bonaria et al. (2019)

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DOI: 10.1109/ETS.2019.8791519

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

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  dblp key:
  - conf/ets/BonariaRRS19
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Luciano Bonaria, Maurizio Raganato, Matteo Sonza Reorda, Giovanni Squillero:
A Dynamic Greedy Test Scheduler for Optimizing Probe Motion in In-Circuit Testers. ETS 2019: 1-2

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