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"Efficient Integrated Circuits Characterization Through Computer Vision ..."

Raphael Abele et al. (2020)

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DOI: 10.1109/ETFA46521.2020.9211922

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Raphael Abele, Jean-Luc Damoiseaux, Daniele Fronte, Pierre-Yvan Liardet, Jean-Marc Boï, Djamal Merad:
Efficient Integrated Circuits Characterization Through Computer Vision Assistance. ETFA 2020: 1247-1250

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