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"Impact of device geometry of the fin Electron-Hole Bilayer Tunnel FET."

Cem Alper et al. (2016)

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DOI: 10.1109/ESSDERC.2016.7599647

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Cem Alper, Jose L. Padilla, Pierpaolo Palestri, Adrian M. Ionescu:
Impact of device geometry of the fin Electron-Hole Bilayer Tunnel FET. ESSDERC 2016: 307-310

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