default search action

combined dblp search
author search
venue search
publication search

ask others

"Test Generation for Stuck-at and Gate-Delay Faults in Sequential Circuits: ..."

Franco Fummi, Donatella Sciuto, Micaela Serra (1994)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2003-01-24

- no documents available
- export record
  dblp key:
  - conf/dft/FummiSS94
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/FummiSS94
Franco Fummi, Donatella Sciuto, Micaela Serra:
Test Generation for Stuck-at and Gate-Delay Faults in Sequential Circuits: A Mixed Functional/Structural Method. DFT 1994: 254-262

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.