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"A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology."

Sandrine Bernardini, Jean-Michel Portal, Pascal Masson (2004)

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DOI: 10.1109/DATE.2004.1269108

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/date/BernardiniPM04
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  persistent URL:
  - https://dblp.org/rec/conf/date/BernardiniPM04
Sandrine Bernardini, Jean-Michel Portal, Pascal Masson:
A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology. DATE 2004: 1404-1405

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