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"AI on edge device for laser chip defect detection."

Dennis Hou et al. (2019)

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DOI: 10.1109/CCWC.2019.8666503

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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  dblp key:
  - conf/ccwc/HouLPH19
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  - https://dblp.org/rec/conf/ccwc/HouLPH19
Dennis Hou, Tuo Liu, Yen-Ting Pan, Janpu Hou:
AI on edge device for laser chip defect detection. CCWC 2019: 247-251

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