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"A Boundary Scan Circuit with Time-to-Digital Converter for Delay Testing."

Hiroyuki Yotsuyanagi, Hiroyuki Makimoto, Masaki Hashizume (2011)

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DOI: 10.1109/ATS.2011.63

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroyuki Yotsuyanagi, Hiroyuki Makimoto, Masaki Hashizume:
A Boundary Scan Circuit with Time-to-Digital Converter for Delay Testing. Asian Test Symposium 2011: 539-544

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