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"Exploit Dynamic Voltage and Frequency Scaling for SoC Test Scheduling ..."

Li Ling, Jianhui Jiang (2014)

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DOI: 10.1109/ATS.2014.36

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Li Ling, Jianhui Jiang:
Exploit Dynamic Voltage and Frequency Scaling for SoC Test Scheduling under Thermal Constraints. ATS 2014: 180-185

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