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"Test Generation for Double Stuck-at Faults."

Yoshinobu Higami, Naoko Takahashi, Yuzo Takamatsu (2001)

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DOI: 10.1109/ATS.2001.990261

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yoshinobu Higami, Naoko Takahashi, Yuzo Takamatsu:
Test Generation for Double Stuck-at Faults. Asian Test Symposium 2001: 71-75

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