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"Non-Intrusive Testing of High-Speed CML Circuits."

Vikram Devdas, André Ivanov (1998)

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DOI: 10.1109/ATS.1998.741610

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Vikram Devdas, André Ivanov:
Non-Intrusive Testing of High-Speed CML Circuits. Asian Test Symposium 1998: 172-178

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