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"Functional Built-In Delay Binning and Calibration Mechanism for On-Chip ..."

Chen-I Chung et al. (2009)

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DOI: 10.1109/ATS.2009.72

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ats/ChungJCL09
Chen-I Chung, Jyun-Sian Jhou, Ching-Hwa Cheng, Sih-Yan Li:
Functional Built-In Delay Binning and Calibration Mechanism for On-Chip at-Speed Self Test. Asian Test Symposium 2009: 163-168

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