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"Fast fault coverage estimation of sequential tests using entropy measurements."

Michael S. Hsiao, Sarmad Tanwir (2018)

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DOI: 10.1109/VTS.2018.8368660

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/HsiaoT18
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  - https://dblp.org/rec/conf/vts/HsiaoT18
Michael S. Hsiao, Sarmad Tanwir:
Fast fault coverage estimation of sequential tests using entropy measurements. VTS 2018: 1-6

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