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"Linear microcircuit fault modeling and detection."

Benjamin R. Epstein et al. (1991)

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DOI: 10.1109/VTEST.1991.208133

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/EpsteinMCG91
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  persistent URL:
  - https://dblp.org/rec/conf/vts/EpsteinMCG91
Benjamin R. Epstein, Steven R. Miller, Martin H. Czigler, David R. Gray:
Linear microcircuit fault modeling and detection. VTS 1991: 59-61

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