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"NBTI Degradation: A Problem or a Scare?"

Kewal K. Saluja et al. (2008)

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DOI: 10.1109/VLSI.2008.43

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/SalujaVSY08
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  - https://dblp.org/rec/conf/vlsid/SalujaVSY08
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootkaneung, Xaingning Yang:
NBTI Degradation: A Problem or a Scare? VLSI Design 2008: 137-142

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