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"Memory Yield Improvement through Multiple Test Sequences and ..."

Aman Kokrady, C. P. Ravikumar, Nitin Chandrachoodan (2008)

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DOI: 10.1109/VLSI.2008.115

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Aman Kokrady, C. P. Ravikumar, Nitin Chandrachoodan:
Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models. VLSI Design 2008: 169-174

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