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"On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit."

Amlan Ghosh et al. (2008)

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DOI: 10.1109/VLSI.2008.67

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/GhoshRKCB08
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/GhoshRKCB08
Amlan Ghosh, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang, Richard B. Brown:
On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit. VLSI Design 2008: 143-149

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