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Toshikazu Nishida
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2010 – 2019
- 2018
- [c7]Kartik Sondhi, Jacob Amontree, Seahee Hwangbo, Sai Guruva Reddy Avuthu, Yong-Kyu Yoon, Z. Hugh Fan, Toshikazu Nishida:
Airbrushed Dipole RF Strain Sensor Antenna on a Stretchable Polyurethane Substrate. IEEE SENSORS 2018: 1-4 - [c6]Grant Walters, Paul Chojecki, Alexandra Garraud, Toshikazu Nishida, Scott R. Summerfelt, J. A. Rodriguez, A. G. Acosta:
High-temperature and high-field cycling reliability of PZT films embedded within 130 nm CMOS. IRPS 2018: 3-1 - [c5]Jacob Amontree, Kartik Sondhi, Seahee Hwangbo, Sai Guruva Reddy Avuthu, Yong-Kyu Yoon, Toshikazu Nishida, Z. Hugh Fan:
Reliability of Passive Printed Dipole Antennas Under Extreme Environments. WiSEE 2018: 119-124 - 2012
- [c4]Abhishek Prasad, Qing-Shan Xue, Viswanath Sankar, Toshikazu Nishida, Gerry Shaw, Wolfgang Streit, Justin C. Sanchez:
Comprehensive characterization of tungsten microwires in chronic neurocortical implants. EMBC 2012: 755-758 - 2011
- [c3]Abhishek Prasad, Viswanath Sankar, Aubrey T. Dyer, Eric Knott, Qing-Shan Xue, Toshikazu Nishida, John R. Reynolds, Gerry Shaw, Wolfgang Streit, Justin C. Sanchez:
Coupling biotic and abiotic metrics to create a testbed for predicting neural electrode performance. EMBC 2011: 3020-3023
2000 – 2009
- 2008
- [j1]Justin C. Sanchez, José C. Príncipe, Toshikazu Nishida, Rizwan Bashirullah, John G. Harris, José A. B. Fortes:
Technology and Signal Processing for Brain-Machine Interfaces. IEEE Signal Process. Mag. 25(1): 29-40 (2008) - 2007
- [c2]Rizwan Bashirullah, John G. Harris, Justin C. Sanchez, Toshikazu Nishida, José Carlos Príncipe:
Florida Wireless Implantable Recording Electrodes (FWIRE) for Brain Machine Interfaces. ISCAS 2007: 2084-2087 - 2006
- [c1]Erin E. Patrick, Matthew Ordonez, Nicolas Alba, Justin C. Sanchez, Toshikazu Nishida:
Design and Fabrication of a Flexible Substrate Microelectrode Array for Brain Machine Interfaces. EMBC 2006: 2966-2969
1980 – 1989
- 1988
- [b1]Toshikazu Nishida:
Investigations of the Electric Field Dependencies of the Generation Rates of Oxide and Interface Traps on Silicon. University of Illinois Urbana-Champaign, USA, 1988
Coauthor Index
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