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Dawei Heh

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2020 – today

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2021
[c1]
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  dblp key:
  - conf/irps/LeeLHHNKCYCWBD21
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  - https://dblp.org/rec/conf/irps/LeeLHHNKCYCWBD21
Yung-Huei Lee, P. J. Liao, Vincent Hou, Dawei Heh, Chih-Hung Nien, Wen-Hsien Kuo, Gary T. Chen, Shao-Ming Yu, Yu-Sheng Chen, Jau-Yi Wu, Xinyu Bao, Carlos H. Diaz:
Composition Segregation of Ge-Rich GST and Its Effect on Reliability. IRPS 2021: 1-6

2000 – 2009

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2007
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  - journals/mr/YoungHNCLB07
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Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker:
Electrical characterization and analysis techniques for the high-kappa era. Microelectron. Reliab. 47(4-5): 479-488 (2007)

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