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Meng-Lieh Sheu
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2020 – today
- 2023
- [c7]Chi-An Tsai
, Pei-Jun Lee
Moving Object Detection for Remote Sensing Video with Satellite Jitter. ICCE 2023: 1-2 - 2021
- [c6]Meng-Lieh Sheu, He-Jin Lee:
CMOS Capacitive Fingerprint Sensing Scheme with Transition Band of Low Pass Filter. ICCE-TW 2021: 1-2
2010 – 2019
- 2014
- [c5]Meng-Lieh Sheu, Te-Hsiang Liu, Lin-Jie Tsao:
A 22.4 fJ/conversion 0.7V 1.6μW 10-bit successive approximation ADC. VLSI-DAT 2014: 1-4 - 2012
- [j6]Meng-Lieh Sheu, Wei-Hung Hsu, Lin-Jie Tsao:
A Capacitance-Ratio-Modulated Current Front-End Circuit With Pulsewidth Modulation Output for a Capacitive Sensor Interface. IEEE Trans. Instrum. Meas. 61(2): 447-455 (2012) - 2011
- [j5]Meng-Lieh Sheu, Yu-Shang Tiao, Lin-Jie Taso:
A 1-V 4-GHz wide tuning range voltage-controlled ring oscillator in 0.18 μm CMOS. Microelectron. J. 42(6): 897-902 (2011) - 2010
- [j4]Meng-Lieh Sheu, Wei-Hung Hsu, Yuan-Chang Huang:
Low Parasitic Capacitance and Low-Power CMOS Capacitive Fingerprint Sensor. J. Inf. Sci. Eng. 26(2): 585-595 (2010) - [j3]Meng-Lieh Sheu, Yu-Sheng Tiao, Hang-Yu Fan, Ji-Jin Huang:
Implementation of a 2.45GHz Passive RFID Transponder Chip in 0.18um CMOS. J. Inf. Sci. Eng. 26(2): 597-610 (2010)
2000 – 2009
- 2007
- [c4]Chih-Wen Lu, Yen-Chih Shen, Meng-Lieh Sheu:
A high-driving class-AB buffer amplifier with a new pseudo source follower. VLSI-SoC 2007: 105-109 - 2005
- [c3]Meng-Lieh Sheu, Ta-Wei Lin, Wei-Hung Hsu:
Wide frequency range voltage controlled ring oscillators based on transmission gates. ISCAS (3) 2005: 2731-2734 - 2002
- [c2]Meng-Lieh Sheu, Tai-Ping Sun, Far-Wen Jih:
Test Socket Chip for Measuring Dark Current in IR FPA. DELTA 2002: 167-171
1990 – 1999
- 1996
- [j2]Chung-Len Lee, Meng-Lieh Sheu:
A Multiple-Sequence Generator Based on Inverted Nonlinear Autonomous Machines. IEEE Trans. Computers 45(9): 1079-1083 (1996) - 1995
- [c1]Meng-Lieh Sheu, Chung-Len Lee:
A programmable multiple-sequence generator for BIST applications. Asian Test Symposium 1995: 279-285 - 1994
- [j1]Meng-Lieh Sheu, Chung-Len Lee:
Simplifying Sequential Circuit Test Generation. IEEE Des. Test Comput. 11(3): 28-38 (1994)
Coauthor Index
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