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Greg G. Freeman
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- affiliation: IBM Systems and Technology Group, Hopewell Junction, NY, USA
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2010 – 2019
- 2011
- [j7]Subramanian S. Iyer, Greg G. Freeman, Colin Brodsky, Anthony I. Chou, Dan Corliss, Sameer H. Jain, Naftali E. Lustig, Vincent McGahay, Shreesh Narasimha, James P. Norum, Karen A. Nummy, Paul C. Parries, Sujatha Sankaran, Chris D. Sheraw, Pushkara Rao Varanasi, Geng Wang, Mary E. Weybright, Xiaojun Yu, Emmanuel Crabbe, Paul D. Agnello:
45-nm silicon-on-insulator CMOS technology integrating embedded DRAM for high-performance server and ASIC applications. IBM J. Res. Dev. 55(3): 5 (2011)
2000 – 2009
- 2005
- [j6]Jae-Sung Rieh, David R. Greenberg, Andreas Stricker, Greg G. Freeman:
Scaling of SiGe Heterojunction Bipolar Transistors. Proc. IEEE 93(9): 1522-1538 (2005) - 2004
- [j5]Greg G. Freeman, Jae-Sung Rieh, Zhijian Yang, Fernando J. Guarín:
Reliability and performance scaling of very high speed SiGe HBTs. Microelectron. Reliab. 44(3): 397-410 (2004) - [c3]John J. Pekarik, David R. Greenberg, Basanth Jagannathan, Robert A. Groves, J. R. Jones, Raminderpal Singh, Anil Chinthakindi, Xudong Wang, Matthew J. Breitwisch, Douglas D. Coolbaugh, Peter E. Cottrell, John E. Florkey, Greg G. Freeman, R. Krishnasamy:
RFCMOS technology from 0.25μm to 65nm: the state of the art. CICC 2004: 217-224 - 2003
- [j4]James S. Dunn, David C. Ahlgren, Douglas D. Coolbaugh, Natalie B. Feilchenfeld, Greg G. Freeman, David R. Greenberg, Robert A. Groves, Fernando J. Guarín, Youssef Hammad, Alvin J. Joseph, Louis D. Lanzerotti, Stephen A. St. Onge, Bradley A. Orner, Jae-Sung Rieh, Kenneth J. Stein, Steven H. Voldman, Ping-Chuan Wang, Michael J. Zierak, Seshadri Subbanna, David L. Harame, Dean A. Herman Jr., Bernard S. Meyerson:
Foundation of rf CMOS and SiGe BiCMOS technologies. IBM J. Res. Dev. 47(2-3): 101-138 (2003) - [j3]Alvin J. Joseph, James S. Dunn, Greg G. Freeman, David L. Harame, Douglas Coolbaugh, Robert A. Groves, Kenneth J. Stein, Rich Volant, Seshadri Subbanna, V. S. Marangos, Stephen St. Onge, Ebenezer Eshun, P. Cooper, Jeffrey B. Johnson, Jae-Sung Rieh, Basanth Jagannathan, Vidhya Ramachandran, David Ahlgren, Dawn Wang, X. Wang:
Product applications and technology directions with SiGe BiCMOS. IEEE J. Solid State Circuits 38(9): 1471-1478 (2003) - 2002
- [j2]Greg G. Freeman, Mounir Meghelli, Young Kwark, Steven Zier, Alexander V. Rylyakov, Michael Sorna, Todd Tanji, Oswin M. Schreiber, Keith Walter, Jae-Sung Rieh, Basanth Jagannathan, Alvin J. Joseph, Seshadri Subbanna:
40-Gb/s circuits built from a 120-GHz fT SiGe technology. IEEE J. Solid State Circuits 37(9): 1106-1114 (2002) - 2001
- [c2]Seshadri Subbanna, Lawrence Larson, Greg G. Freeman, David Ahlgren, Kenneth J. Stein, Carl E. Dickey, James Mecke, A. Rincon, P. Bacon, Robert A. Groves, Mehmet Soyuer, David L. Harame, James S. Dunn, David Rowe, W. Chon, Dean A. Herman Jr., Bernard S. Meyerson:
Silicon-germanium BiCMOS technology and a CAD environment for 2-40 GHz VLSI mixed-signal ICs. CICC 2001: 559-566
1990 – 1999
- 1998
- [j1]K. M. Walter, B. Ebersman, D. A. Sunderland, G. D. Berg, Greg G. Freeman, Robert A. Groves, D. K. Jadus, David L. Harame:
A scaleable, statistical SPICE Gummel-Poon model for SiGe HBTs. IEEE J. Solid State Circuits 33(9): 1439-1444 (1998)
1980 – 1989
- 1986
- [c1]Greg G. Freeman, Dick L. Liu, Bruce A. Wooley, Edward J. McCluskey:
Two CMOS Metastability Sensors. ITC 1986: 140-144
Coauthor Index
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