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Tohru Mogami
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2010 – 2019
- 2018
- [c5]Tsuyoshi Horikawa, Tohru Mogami:
Spectral variation analysis of integrated silicon photonics devices by using optical wafer probing. ICICDT 2018: 161-164 - 2017
- [c4]Tsuyoshi Horikawa, Daisuke Shimura, Hiroyuki Takahashi, Jun Ushida, Yohei Sobu, Akemi Shiina, Masatoshi Tokushima, Seok-Hwan Jeong, Keizo Kinoshita, Tohru Mogami:
Resonant Wavelength Variation Modelling for Microring Resonators based on Fabrication Deviation Analysis. ECOC 2017: 1-3 - [c3]Tohru Mogami, Tsuyoshi Horikawa, Keizo Kinoshita:
High-performance silicon photonics platform for low-power photonic integrated circuits. MIXDES 2017: 17-18 - 2013
- [j6]Satoshi Takaya, Yoji Bando, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata:
Measurements and Simulation of Sensitivity of Differential-Pair Transistors against Substrate Voltage Variation. IEICE Trans. Electron. 96-C(6): 884-893 (2013) - 2012
- [j5]Yoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata:
On-Chip In-Place Measurements of Vth and Signal/Substrate Response of Differential Pair Transistors. IEICE Trans. Electron. 95-C(1): 137-145 (2012) - [c2]Hironori Sakamoto, Shigetaka Kumashiro, Shigeo Sato, Naoki Wakita, Tohru Mogami:
HiSIM-RP: A reverse-profiling based 1st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS. ISQED 2012: 553-560 - 2011
- [j4]Yoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata:
A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits. IEICE Trans. Electron. 94-C(4): 495-503 (2011) - [j3]Masaaki Souda, Yoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata:
On-Chip Single Tone Pseudo-Noise Generator for Analog IP Noise Tolerance Measurement. IEICE Trans. Electron. 94-C(6): 1024-1031 (2011) - [c1]Satoshi Takaya, Yoji Bando, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata:
Accurate analysis of substrate sensitivity of active transistors in an analog circuit. ISQED 2011: 56-61
2000 – 2009
- 2003
- [j2]Akira Tanabe, Yasushi Nakahara, Akio Furukawa, Tohru Mogami:
A redundant multivalued logic for a 10-Gb/s CMOS demultiplexer IC. IEEE J. Solid State Circuits 38(1): 107-113 (2003)
1990 – 1999
- 1997
- [j1]Masanori Izumikawa, Hiroyuki Igura, Hitoshi Wakabayashi, Ken Nakajima, Tohru Mogami, Tadahiko Horiuchi, Masakazu Yamashina:
A 0.25-μm CMOS 0.9-V 100-MHz DSP core. IEEE J. Solid State Circuits 32(1): 52-61 (1997)
Coauthor Index
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