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Massimo Vanzi
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2020 – today
- 2021
- [c4]Anna Concas, Riccardo Dessì, Caterina Fenu, Giuseppe Rodriguez
, Massimo Vanzi:
Identifying the lights position in photometric stereo under unknown lighting. ICCSA (Workshops) 2021: 10-20
2010 – 2019
- 2018
- [j43]Massimo Vanzi
Further improvements of an extended Hakki-Paoli method. Microelectron. Reliab. 88-90: 859-863 (2018) - 2017
- [j42]Massimo Vanzi, Giulia Marcello, Giovanna Mura
Practical optical gain by an extended Hakki-Paoli method. Microelectron. Reliab. 76-77: 579-583 (2017) - 2016
- [j41]Massimo Vanzi, Giovanna Mura
ESD tests on 850 nm GaAs-based VCSELs. Microelectron. Reliab. 64: 617-622 (2016) - 2015
- [j40]Riccardo Dessì, Carla Mannu, Giuseppe Rodriguez
Recent improvements in photometric stereo for rock art 3D imaging. Digit. Appl. Archaeol. Cult. Heritage 2(2-3): 132-139 (2015) - [j39]Massimo Vanzi, Giovanna Mura
Clamp voltage and ideality factor in laser diodes. Microelectron. Reliab. 55(9-10): 1736-1740 (2015) - 2014
- [j38]Giovanna Mura
FIB-induced electro-optical alterations in a DFB InP laser diode. Microelectron. Reliab. 54(9-10): 2151-2153 (2014) - 2013
- [j37]Massimo Vanzi, Simona Podda, Elodia Musu, Robert Cao:
XEBIC at the Dual Beam. Microelectron. Reliab. 53(9-11): 1399-1402 (2013) - [j36]Matteo Dal Lago, Matteo Meneghini
"Hot-plugging" of LED modules: Electrical characterization and device degradation. Microelectron. Reliab. 53(9-11): 1524-1528 (2013) - [j35]Massimo Vanzi, Giovanna Mura
Optical losses in single-mode laser diodes. Microelectron. Reliab. 53(9-11): 1529-1533 (2013) - [j34]Giovanna Mura
The role of the optical trans-characteristics in laser diode analysis. Microelectron. Reliab. 53(9-11): 1538-1542 (2013) - [j33]Alessandro Compagnin, Matteo Meneghini
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectron. Reliab. 53(9-11): 1809-1813 (2013) - 2012
- [j32]Matteo Meneghini
Chip and package-related degradation of high power white LEDs. Microelectron. Reliab. 52(5): 804-812 (2012) - [j31]Matteo Dal Lago, Matteo Meneghini
Phosphors for LED-based light sources: Thermal properties and reliability issues. Microelectron. Reliab. 52(9-10): 2164-2167 (2012) - 2011
- [j30]Massimo Vanzi, Giovanna Mura
DC parameters for laser diodes from experimental curves. Microelectron. Reliab. 51(9-11): 1752-1756 (2011) - [j29]Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi:
An original DoE-based tool for silicon photodetectors EoL estimation in space environments. Microelectron. Reliab. 51(9-11): 1999-2003 (2011) - 2010
- [j28]Massimo Vanzi:
Editorial. Microelectron. Reliab. 50(4): 455 (2010) - [j27]Giovanna Mura
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis. Microelectron. Reliab. 50(4): 471-478 (2010)
2000 – 2009
- 2009
- [j26]Giovanna Mura
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. Microelectron. Reliab. 49(9-11): 1196-1199 (2009) - 2008
- [j25]Giovanna Mura
Sulfur-contamination of high power white LED. Microelectron. Reliab. 48(8-9): 1208-1211 (2008) - [j24]Ruggero Pintus
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy. IEEE Trans. Instrum. Meas. 57(5): 989-996 (2008) - [c3]Massimo Vanzi:
A model for the DC characteristics of a laser diode. ICECS 2008: 874-877 - 2007
- [j23]Matteo Meneghini
High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectron. Reliab. 47(9-11): 1625-1629 (2007) - [c2]Reimund Wittmann, Massimo Vanzi, Hans-Joachim Wassener, Navraj Nandra, Joachim Kunkel, José E. da Franca, Christian Münker:
Life begins at 65: unless you are mixed signal? DATE 2007: 936-941 - 2006
- [j22]Matteo Meneghini
High brightness GaN LEDs degradation during dc and pulsed stress. Microelectron. Reliab. 46(9-11): 1720-1724 (2006) - [j21]G. Cassanelli, Giovanna Mura
Failure Analysis-assisted FMEA. Microelectron. Reliab. 46(9-11): 1795-1799 (2006) - 2005
- [j20]G. Cassanelli, Giovanna Mura
Reliability predictions in electronic industrial applications. Microelectron. Reliab. 45(9-11): 1321-1326 (2005) - [j19]Ruggero Pintus
Image alignment for 3D reconstruction in a SEM. Microelectron. Reliab. 45(9-11): 1581-1584 (2005) - [c1]Francesca Mighela, Cristian Perra, Massimo Vanzi:
Video Streaming in Electron Microscopy Applications. VLBV 2005: 115-120 - 2004
- [j18]Ruggero Pintus
Quantitative 3D reconstruction from BS imaging. Microelectron. Reliab. 44(9-11): 1547-1552 (2004) - [j17]Giovanna Mura
Failure analysis of RFIC amplifiers. Microelectron. Reliab. 44(9-11): 1599-1604 (2004) - [j16]Simona Podda, G. Cassanelli, Fausto Fantini
Failure Analysis of RuO2 Thick Film Chip Resistors. Microelectron. Reliab. 44(9-11): 1763-1767 (2004) - 2003
- [j15]Gaudenzio Meneghesso
Reliability of visible GaN LEDs in plastic package. Microelectron. Reliab. 43(9-11): 1737-1742 (2003) - [j14]Giovanna Mura
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectron. Reliab. 43(9-11): 1771-1776 (2003) - 2002
- [j13]Fausto Fantini, Massimo Vanzi:
Editorial. Microelectron. Reliab. 42(9-11): 1249 (2002) - [j12]Gaudenzio Meneghesso, A. Cocco, Giovanna Mura
Backside Failure Analysis of GaAs ICs after ESD tests. Microelectron. Reliab. 42(9-11): 1293-1298 (2002) - [j11]Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectron. Reliab. 42(9-11): 1303-1306 (2002) - [j10]M. Giglio, G. Martines, Giovanna Mura
An automated lifetest equipment for optical emitters. Microelectron. Reliab. 42(9-11): 1311-1315 (2002) - [j9]Massimo Vanzi, Giulia Salmini, R. Pastorelli, S. Pessina, Paola Furcas:
Reliability tests on WDM filters. Microelectron. Reliab. 42(9-11): 1317-1321 (2002) - [j8]C. Caprile, Ilaria De Munari, Maurizio Impronta, Simona Podda, Andrea Scorzoni, Massimo Vanzi:
A specimen-current branching approach for FA of long Electromigration test lines. Microelectron. Reliab. 42(9-11): 1715-1718 (2002) - 2001
- [j7]Daniel L. Barton, Shigeru Nakajima, Massimo Vanzi:
Editorial. Microelectron. Reliab. 41(8): 1143-1144 (2001) - [j6]Paola Furcas, Rosaria De Palo, Maria Elena Patella, Giulia Salmini, Massimo Vanzi:
Damp Heat test on LiNbO optical modulators. Microelectron. Reliab. 41(9-10): 1603-1607 (2001) - [j5]Gaudenzio Meneghesso
Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs. Microelectron. Reliab. 41(9-10): 1609-1614 (2001)
1980 – 1989
- 1988
- [j4]Claudio Canali, Manuela Giannini, Andrea Scorzoni, Massimo Vanzi, Enrico Zanoni:
Measurement of the local latch-up sensitivity by means of computer-controller scanning electron microscopy. IEEE J. Solid State Circuits 23(2): 597-603 (1988) - [j3]Claudio Lombardi, Stefano Manzini, Antonio Saporito, Massimo Vanzi:
A physically based mobility model for numerical simulation of nonplanar devices. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(11): 1164-1171 (1988) - 1987
- [j2]Zhiping Yu, Robert W. Dutton, Massimo Vanzi:
An Extension to Newton's Method in Device Simulators--On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 6(1): 41-45 (1987) - 1986
- [j1]Claudio Turchetti, P. Prioretti, Guido Masetti, E. Profumo, Massimo Vanzi:
A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(4): 499-507 (1986)
Coauthor Index
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