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Wen Chen 0016
Person information
- affiliation: NXP Semiconductors Inc.
- affiliation (former): University of California, Santa Barbara, CA, USA
Other persons with the same name
- Wen Chen — disambiguation page
- Wen Chen 0001
— Shanghai Jiao Tong University, Department of Electronic Engineering, China
- Wen Chen 0002 — Diaologic (and 1 more)
- Wen Chen 0003
- Wen Chen 0004 — University of Alberta
- Wen Chen 0005 — Institute of Applied Physics and Computational Mathematics, Beijing
- Wen Chen 0006
- Wen Chen 0007
- Wen Chen 0008 — Nanjing University of Aeronautics & Astronautics
- Wen Chen 0009 — Shanghai Jiao Tong University, National Die and Mold CAD Engineering Research Center, China
- Wen Chen 0010 — Northeastern University, Liaoning
- Wen Chen 0011 — Nanyang Technological University
- Wen Chen 0013 — Waseda University
- Wen Chen 0014
- Wen Chen 0015
- Wen Chen 0017
- Wen Chen 0018
- Wen Chen 0019
- Wen Chen 0020
- Wen Chen 0021
- Wen Chen 0022 — Sensetime Research, Beijing, Shanghai, China
- Wen Chen 0023
- Wen Chen 0024 — Harbin Institute of Technology, School of Electronics and Information Engineering, China
- Wen Chen 0025 — Sichuan University, College of Cybersecurity, Chengdu, China (and 1 more)
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2020 – today
- 2021
- [c12]Sarvesh Patankar, Sainath Karlapalem, Sakshi Biyani, Wen Chen, Roman Chovanec, Martin Vlk, Martin Kaspar:
Hybrid Methodology for Verification of SW Safety Mechanisms. VTS 2021: 1-4
2010 – 2019
- 2019
- [j4]Wen Chen
Practices and Challenges for Achieving Functional Safety of Modern Automotive SoCs. IEEE Des. Test 36(4): 31-47 (2019) - 2018
- [c11]Sandip Ray, Wen Chen, Rosario Cammarota:
Protecting the supply chain for automotives and IoTs. DAC 2018: 89:1-89:4 - 2017
- [j3]Magdy S. Abadir, Jayanta Bhadra, Wen Chen, Li-C. Wang:
Guest Editors' Introduction: Emerging Challenges and Solutions in SoC Verification. IEEE Des. Test 34(5): 5-6 (2017) - [j2]Wen Chen
Challenges and Trends in Modern SoC Design Verification. IEEE Des. Test 34(5): 7-22 (2017) - [j1]Wen Chen
Data-Driven Test Plan Augmentation for Platform Verification. IEEE Des. Test 34(5): 23-29 (2017) - [c10]Kuo-Kai Hsieh, Sebastian Siatkowski, Li-C. Wang, Wen Chen, Jayanta Bhadra:
Feature extraction from design documents to enable rule learning for improving assertion coverage. ASP-DAC 2017: 51-56 - [c9]Sandip Ray, Wen Chen, Jayanta Bhadra, Mohammad Abdullah Al Faruque
Extensibility in Automotive Security: Current Practice and Challenges: Invited. DAC 2017: 14:1-14:6 - [c8]Kuo-Kai Hsieh, Li-C. Wang, Wen Chen, Jayanta Bhadra:
Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery. DAC 2017: 34:1-34:6 - 2016
- [c7]Wen Chen, Jayanta Bhadra:
Striking a balance between SoC security and debug requirements. SoCC 2016: 368-373 - 2014
- [b1]Wen Chen:
Data Learning Methodologies for Improving the Efficiency of Constrained Random Verification. University of California, Santa Barbara, USA, 2014 - [c6]Kuo-Kai Hsieh, Wen Chen, Li-C. Wang
On application of data mining in functional debug. ICCAD 2014: 670-675 - 2013
- [c5]Wen Chen, Li-C. Wang
Simulation knowledge extraction and reuse in constrained random processor verification. DAC 2013: 120:1-120:6 - [c4]Wen Chen, Li-C. Wang
Novel test analysis to improve structural coverage - A commercial experiment. VLSI-DAT 2013: 1-4 - 2012
- [c3]Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir:
Novel test detection to improve simulation efficiency - A commercial experiment. ICCAD 2012: 101-108 - [c2]Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang
Functional test content optimization for peak-power validation - An experimental study. ITC 2012: 1-10 - [c1]Magdy S. Abadir, Nik Sumikawa, Wen Chen, Li-C. Wang:
Data mining based prediction paradigm and its applications in design automation. VLSI-DAT 2012: 1
Coauthor Index
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