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Bin Liu 0032
Person information
- affiliation: Beihang University, School of Reliability and Systems Engineering, Beijing, China
Other persons with the same name
- Bin Liu — disambiguation page
- Bin Liu 0001
— Tsinghua University, Department of Computer Science and Technology, Laboratory of Broadband Network Switching Technology and Communications, Beijing, China (and 1 more)
- Bin Liu 0002 — NEC Labs America (and 1 more)
- Bin Liu 0003
- Bin Liu 0004 — Samsung (and 1 more)
- Bin Liu 0005 — GLC Asset Management (and 1 more)
- Bin Liu 0006 — University of California, Los Angeles, CA, USA
- Bin Liu 0007 — EDA Lab, Department of Computer Science and Technology, Tsinghua University
- Bin Liu 0008 — Information Engineering University, China
- Bin Liu 0009
- Bin Liu 0010 — Georgia Institute of Technology
- Bin Liu 0011 — Henan Agricultural University, Department of Management Science, Zhengzhou, China (and 1 more)
- Bin Liu 0012 — Telecom ParisTech, France
- Bin Liu 0013 — Huazhong University of Science and Technology
- Bin Liu 0014
- Bin Liu 0015 — State Key Laboratory of Intelligent Technology and Systems, Department of Automation, Tsinghua University
- Bin Liu 0016
- Bin Liu 0017
- Bin Liu 0018 — Tongji University, Shanghai, China
- Bin Liu 0019
- Bin Liu 0021
- Bin Liu 0022
- Bin Liu 0023
- Bin Liu 0024
- Bin Liu 0025
- Bin Liu 0026
- Bin Liu 0027
- Bin Liu 0028
- Bin Liu 0029
- Bin Liu 0030
- Bin Liu 0031
- Bin Liu 0033
- Bin Liu 0034
- Bin Liu 0035
- Bin Liu 0036
- Bin Liu 0037 — University of California, Davis, Department of Electrical and Computer Engineering, CA, USA
- Bin Liu 0038
- Bin Liu 0039
- Bin Liu 0040
- Bin Liu 0041
- Bin Liu 0042
- Bin Liu 0043 — Southeast University, Zhong-Da Hospital, Department of Radiology, Nanjing, China
- Bin Liu 0044 — Yanshan University, School of Information Science and Engineering, Qinhuangdao, China
- Bin Liu 0045
- Bin Liu 0046
- Bin Liu 0047
- Bin Liu 0048
- Bin Liu 0049
- Bin Liu 0050
- Bin Liu 0051
- Bin Liu 0052
- Bin Liu 0053
- Bin Liu 0054
- Bin Liu 0055
- Bin Liu 0056
- Bin Liu 0057
- Bin Liu 0058
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2020 – today
- 2024
- [j22]Wentao Wu, Shihai Wang, Bin Liu, Yuanxun Shao, Wandong Xie:
A novel software defect prediction approach via weighted classification based on association rule mining. Eng. Appl. Artif. Intell. 129: 107622 (2024) - [j21]Yujie Ren
Joint Instance and Feature Adaptation for Heterogeneous Defect Prediction. IEEE Trans. Reliab. 73(1): 741-756 (2024) - 2022
- [j20]Haonan Tong
SHSE: A subspace hybrid sampling ensemble method for software defect number prediction. Inf. Softw. Technol. 142: 106747 (2022) - [j19]Can Cui, Bin Liu, Shihai Wang
WIFLF: An approach independent of the target project for cross-project defect prediction. J. Softw. Evol. Process. 34(12) (2022) - [c6]Xunli Yang, Bin Liu, Dong An, Wandong Xie, Wei Wu:
A Fault Localization Method Based on Similarity Weighting with Unlabeled Test Cases. QRS Companion 2022: 368-374 - 2021
- [j18]Xiaobo Yan, Bin Liu, Shihai Wang, Dong An, Feng Zhu, Yelin Yang:
Efilter: An effective fault localization based on information entropy with unlabelled test cases. Inf. Softw. Technol. 134: 106543 (2021) - [j17]Xiaobo Yan, Bin Liu, Shihai Wang:
A Test Restoration Method based on Genetic Algorithm for effective fault localization in multiple-fault programs. J. Syst. Softw. 172: 110861 (2021) - [j16]Haonan Tong
Kernel Spectral Embedding Transfer Ensemble for Heterogeneous Defect Prediction. IEEE Trans. Software Eng. 47(9): 1886-1906 (2021) - 2020
- [j15]Yuanxun Shao, Bin Liu, Shihai Wang, Guoqi Li:
Software defect prediction based on correlation weighted class association rule mining. Knowl. Based Syst. 196: 105742 (2020) - [j14]Peng Xiao
Adaptive Testing Based on Moment Estimation. IEEE Trans. Syst. Man Cybern. Syst. 50(3): 911-922 (2020) - [c5]Shudi Guo, Shihai Wang, Bin Liu, Tengfei Shi:
KBAA: An adversarial example generation method for KBQA task. DSA 2020: 313-318
2010 – 2019
- 2019
- [j13]Xiaobo Yan, Bin Liu, Shihai Wang
An Analysis on the Negative Effect of Multiple-Faults for Spectrum-Based Fault Localization. IEEE Access 7: 2327-2347 (2019) - [i1]Haonan Tong, Bin Liu, Shihai Wang, Qiuying Li:
Transfer-Learning Oriented Class Imbalance Learning for Cross-Project Defect Prediction. CoRR abs/1901.08429 (2019) - 2018
- [j12]Rongbin Han, Shihai Wang
A Novel Model-Based Dynamic Analysis Method for State Correlation With IMA Fault Recovery. IEEE Access 6: 22094-22107 (2018) - [j11]Jian Ma
Predicting the Remaining Useful Life of an Aircraft Engine Using a Stacked Sparse Autoencoder with Multilayer Self-Learning. Complex. 2018: 3813029:1-3813029:13 (2018) - [j10]Yuanxun Shao
A novel software defect prediction based on atomic class-association rule mining. Expert Syst. Appl. 114: 237-254 (2018) - [j9]Haonan Tong, Bin Liu, Shihai Wang:
Software defect prediction using stacked denoising autoencoders and two-stage ensemble learning. Inf. Softw. Technol. 96: 94-111 (2018) - [j8]Peng Xiao
Feedback-based integrated prediction: Defect prediction based on feedback from software testing process. J. Syst. Softw. 143: 159-171 (2018) - 2017
- [c4]Xiaobo Yan, Bin Liu, Jianxing Li:
The Failure Behaviors of Multi-Faults Programs: An Empirical Study. QRS Companion 2017: 1-7 - [c3]Peng Xiao, Bin Liu, Xiaobo Yan, Fuqun Huang
How Domain Knowledge Accumulation Influences Software Defects: An Empirical Analysis. QRS Companion 2017: 24-30 - 2016
- [j7]Quan Zhang, Shihai Wang, Bin Liu:
Approach for integrated modular avionics reconfiguration modelling and reliability analysis based on AADL. IET Softw. 10(1): 18-25 (2016) - [j6]Xiaoxu Diao, Bin Liu, Shihai Wang:
A survey of avionics analysis and simulation based on AADL model. Int. J. Inf. Commun. Technol. 9(3): 282-299 (2016) - [c2]Zhengwei Yu, Peng Xiao, Yumei Wu, Bin Liu, Lijin Wu:
A Novel Automated GUI Testing Echnology Based on Image Recognition. HPCC/SmartCity/DSS 2016: 144-149 - 2015
- [j5]Fuqun Huang
The impact of software process consistency on residual defects. J. Softw. Evol. Process. 27(9): 625-646 (2015) - 2014
- [j4]Dongyi Ling, Shihai Wang, Bin Liu, Xiaoqi Xing:
Reliability Evaluation based on the AADL Architecture Model. J. Networks 9(10): 2721-2727 (2014) - [j3]Fuqun Huang
The links between human error diversity and software diversity: Implications for fault diversity seeking. Sci. Comput. Program. 89: 350-373 (2014) - 2010
- [j2]Yongfeng Yin, Bin Liu, Duo Su:
Research on Formal Verification Technique for Aircraft Safety-Critical Software. J. Comput. 5(8): 1152-1159 (2010) - [j1]Yongfeng Yin, Bin Liu, Zhen Li, Chun Zhang, Ning Wu:
The Integrated Application Based on Real-time Extended UML and Improved Formal Method in Real-time Embedded Software Testing. J. Networks 5(12): 1410-1416 (2010)
2000 – 2009
- 2009
- [c1]Yongfeng Yin, Bin Liu, Bentao Zheng:
On Test Script Technique Oriented Automation of Embedded Software Simulation Testing. CSIE (7) 2009: 727-732
Coauthor Index
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