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Phil Nigh
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2010 – 2019
- 2016
- [c36]Phil Nigh:
Testing in the year 2024 - big changes are coming. ETS 2016: 1 - 2014
- [c35]C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy:
Board manufacturing test correlation to IC manufacturing test. ITC 2014: 1-8 - 2013
- [c34]Matt Grady, Bradley Pepper, Joshua Patch, Michael Degregorio, Phil Nigh:
Adaptive testing - Cost reduction through test pattern sampling. ITC 2013: 1-8 - 2012
- [j4]Anne E. Gattiker, Phil Nigh:
Guest Editors' Introduction: Yield Learning Processes and Methods. IEEE Des. Test Comput. 29(1): 6-7 (2012) - [j3]Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar:
Physically-Aware N-Detect Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(2): 308-321 (2012) - [c33]Phil Nigh:
How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond? ITC 2012: 1-4 - 2011
- [c32]Anne E. Gattiker, Phil Nigh:
Using well/substrate bias manipulation to enhance voltage-test-based defect detection. ITC 2011: 1-6 - [c31]Phil Nigh:
Industry leaders panel - How will testing change in the next 10 years? ITC 2011: 1
2000 – 2009
- 2009
- [c30]Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin:
Application of non-parametric statistics of the parametric response for defect diagnosis. ITC 2009: 1-10 - 2008
- [c29]Phil Nigh:
The Evolving Role of Test ... it is now a "Value Add" Operation. DFT 2008: 3-3 - [c28]Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar:
Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. ITC 2008: 1-9 - [c27]François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh:
How Many Test Patterns are Useless? VTS 2008: 23-28 - 2006
- [j2]Phil Nigh:
Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. IEEE Des. Test Comput. 23(2): 86-87 (2006) - [c26]Phil Nigh:
Session Abstract. VTS 2006: 44 - 2005
- [c25]Vikram Iyengar, Phil Nigh:
Defect-Oriented Test for Ultra-Low DPM. Asian Test Symposium 2005: 455 - 2004
- [c24]Phil Nigh, Anne E. Gattiker:
Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. ITC 2004: 309-318 - [c23]Phil Nigh:
Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. ITC 2004: 1420 - [c22]Phil Nigh:
Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". ITC 2004: 1429 - 2003
- [c21]Phil Nigh:
The Increasing Importance of On-line Testing to Ensure High-Reliability Products. ITC 2003: 1281 - 2002
- [c20]Phil Nigh:
Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. ITC 2002: 1198 - [c19]Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers:
Debating the Future of Burn-In. VTS 2002: 311-314 - 2001
- [c18]Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh:
MINVDD Testing for Weak CMOS ICs. VTS 2001: 339-345 - 2000
- [c17]Phil Nigh, Anne E. Gattiker:
Test method evaluation experiments and data. ITC 2000: 454-463
1990 – 1999
- 1999
- [c16]Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong:
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1999: 1152-1161 - 1998
- [c15]Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh:
Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10 - [c14]Phil Nigh, David P. Vallett, Atul Patel, Jason Wright:
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1998: 43-52 - [c13]Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika:
Diagnosis and characterization of timing-related defects by time-dependent light emission. ITC 1998: 733-739 - [c12]Phil Nigh:
SIA Roadmap: test must not limit future technologies. ITC 1998: 1152 - [c11]Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh:
Best Methods for At-Speed Testing? VTS 1998: 460-461 - 1997
- [c10]Phil Nigh, Donato O. Forlenza, Franco Motika:
Application and Analysis of IDDQ Diagnostic Software. ITC 1997: 319-327 - [c9]Adit D. Singh, Phil Nigh, C. Mani Krishna:
Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. ITC 1997: 362-369 - [c8]Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly:
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038 - [c7]Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken:
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459 - 1996
- [c6]Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck:
Volume Manufacturing - ICs and Boards: DFT to the Rescue? VTS 1996: 212-213 - 1994
- [c5]Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix:
ASIC Test Cost/Strategy Trade-offs. ITC 1994: 93-102 - 1990
- [j1]Phil Nigh, Wojciech Maly:
Test Generation for Current Testing (CMOS ICs). IEEE Des. Test Comput. 7(1): 26-38 (1990)
1980 – 1989
- 1989
- [c4]Phil Nigh, Wojciech Maly:
Layout-driven test generation. ICCAD 1989: 154-157 - 1988
- [c3]Wojciech Maly, Phil Nigh:
Built-in current testing-feasibility study. ICCAD 1988: 340-343 - [c2]Wojciech Maly, Pranab K. Nag, Phil Nigh:
Testing oriented analysis of CMOS ICs with opens. ICCAD 1988: 344-347 - [c1]Derek Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly:
Current sensing for built-in testing of CMOS circuits. ICCD 1988: 454-457
Coauthor Index
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