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Hisao Katto

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1990 – 1999

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1993
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Eiji Takeda, Kunihiko Ikuzaki, Hisao Katto, Yuzuru Ohji, Kenji Hinode, Akemi Hamada, Toshiyuki Sakuta, Takahiro Funabiki, Toshio Sasaki:
VLSI reliability challenges: from device physics to wafer scale systems. Proc. IEEE 81(5): 653-674 (1993)

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