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André K. Nieuwland
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2000 – 2009
- 2008
- [j5]Daniele Rossi
, André K. Nieuwland, Cecilia Metra:
Simultaneous Switching Noise: The Relation between Bus Layout and Coding. IEEE Des. Test Comput. 25(1): 76-86 (2008) - [j4]Daniele Rossi
Power Consumption of Fault Tolerant Busses. IEEE Trans. Very Large Scale Integr. Syst. 16(5): 542-553 (2008) - 2006
- [c9]André K. Nieuwland, Samir Jasarevic, Goran Jerin:
Combinational Logic Soft Error Analysis and Protection. IOLTS 2006: 99-104 - 2005
- [j3]Daniele Rossi
Exploiting ECC Redundancy to Minimize Crosstalk Impact. IEEE Des. Test Comput. 22(1): 59-70 (2005) - [j2]Daniele Rossi
New ECC for Crosstalk Impact Minimization. IEEE Des. Test Comput. 22(4): 340-348 (2005) - [c8]André K. Nieuwland, Atul Katoch, Daniele Rossi
Coding Techniques for Low Switching Noise in Fault Tolerant Busses. IOLTS 2005: 183-189 - [c7]Régis Leveugle, Yervant Zorian, Luca Breveglieri, André K. Nieuwland, Klaus Rothbart, Jean-Pierre Seifert:
On-Line Testing for Secure Implementations: Design and Validation. IOLTS 2005: 211 - 2004
- [j1]André K. Nieuwland, Richard P. Kleihorst:
IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors. J. Electron. Test. 20(5): 533-542 (2004) - [c6]Claudia Kretzschmar, André K. Nieuwland, Dietmar Müller:
Why Transition Coding for Power Minimization of On-Chip Buses Does Not Work. DATE 2004: 512-517 - [c5]Daniele Rossi, A. Muccio, André K. Nieuwland, Atul Katoch, Cecilia Metra:
Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems. IOLTS 2004: 135-140 - [c4]André K. Nieuwland, Patrick Gindner:
Automated Logic SER Analysis and On-Line SER reduction. IOLTS 2004: 177 - [c3]André K. Nieuwland, Atul Katoch, Maurice Meijer:
Reducing Cross-Talk Induced Power Consumption and Delay. PATMOS 2004: 179-188 - 2003
- [c2]Daniele Rossi
Power Consumption of Fault Tolerant Codes: the Active Elements. IOLTS 2003: 61-67 - [c1]André K. Nieuwland, Richard P. Kleihorst:
The positive effect on IC yield of embedded Fault Tolerance for SEUs. IOLTS 2003: 75-
Coauthor Index
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