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Pei-Yao Chang
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2020 – today
- 2021
- [j6]Kuo-Hsiung Tseng, Meng-Yun Chung, Li-Hsien Chen, Pei-Yao Chang:
Green Smart Campus Monitoring and Detection Using LoRa. Sensors 21(19): 6582 (2021)
2010 – 2019
- 2016
- [j5]Po-Hao Wang
, Wei-Chung Cheng, Yung-Hui Yu, Tang-Chieh Kao, Chi-Lun Tsai, Pei-Yao Chang, Tay-Jyi Lin, Jinn-Shyan Wang, Tien-Fu Chen:
Zero-Counting and Adaptive-Latency Cache Using a Voltage-Guardband Breakthrough for Energy-Efficient Operations. IEEE Trans. Circuits Syst. II Express Briefs 63-II(10): 969-973 (2016) - 2015
- [j4]Jinn-Shyan Wang, Yung-Chen Chien, Fengzhi Liu, Pei-Yao Chang:
A Calibration-Free PVTD-Variation-Tolerant Sensing Scheme for Footless-8T SRAM Designs. IEEE Trans. Multi Scale Comput. Syst. 1(3): 159-167 (2015) - 2013
- [c3]Tay-Jyi Lin, Cheng-An Chien, Pei-Yao Chang, Ching-Wen Chen, Po-Hao Wang, Ting-Yu Shyu, Chien-Yung Chou, Shien-Chun Luo, Jiun-In Guo, Tien-Fu Chen, Gene C. H. Chuang, Yuan-Hua Chu, Liang-Chia Cheng, Hong-Men Su, Chewnpu Jou, Meikei Ieong, Cheng-Wen Wu
A 0.48V 0.57nJ/pixel video-recording SoC in 65nm CMOS. ISSCC 2013: 158-159 - [c2]Po-Hao Wang, Wei-Chung Cheng, Yung-Hui Yu, Tang-Chieh Kao, Chi-Lun Tsai, Pei-Yao Chang, Tay-Jyi Lin, Jinn-Shyan Wang, Tien-Fu Chen:
Variation-aware and adaptive-latency accesses for reliable low voltage caches. VLSI-SoC 2013: 358-363 - 2012
- [j3]Jinn-Shyan Wang, Pei-Yao Chang, Chi-Chang Lin:
Design of 65 nm Sub-Threshold SRAM Using the Bitline Leakage Prediction Scheme and the Non-trimmed Sense Amplifier. IEICE Trans. Electron. 95-C(1): 172-175 (2012) - [j2]Pei-Yao Chang, Tay-Jyi Lin, Jinn-Shyan Wang, Yen-Hsiang Yu:
A 4R/2W Register File Design for UDVS Microprocessors in 65-nm CMOS. IEEE Trans. Circuits Syst. II Express Briefs 59-II(12): 908-912 (2012) - 2011
- [j1]Jinn-Shyan Wang, Pei-Yao Chang, Tai-Shin Tang, Jia-Wei Chen, Jiun-In Guo:
Design of Subthreshold SRAMs for Energy-Efficient Quality-Scalable Video Applications. IEEE J. Emerg. Sel. Topics Circuits Syst. 1(2): 183-192 (2011) - [c1]Chingwei Yeh, Yan-Nan Liu, Jinn-Shyan Wang, Pei-Yao Chang:
Variation-resilient voltage generation for SRAM weak cell testing. ASICON 2011: 248-251
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