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Fabio Coccetti
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- affiliation: LAAS, Toulouse, France
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2010 – 2019
- 2017
- [c3]Mesut Inac, Grzegorz Lupina, Matthias Wietstruck, Marco Lisker, Mirko Fraschke, Andreas Mai
, Fabio Coccetti, Mehmet Kaynak:
200 mm Wafer level graphene transfer by wafer bonding technique. ESSDERC 2017: 216-219 - 2015
- [j17]Mihai Alexandru, Thierry Monteil, Petr Lorenz, Fabio Coccetti, Hervé Aubert
Large electromagnetic simulation by hybrid approach on large-scale parallel computing systems. Concurr. Comput. Pract. Exp. 27(13): 3184-3204 (2015) - 2013
- [j16]Nuria Torres Matabosch, Fabio Coccetti, Mehmet Kaynak, Beatrice Espana, Bernd Tillack, Jean-Louis Cazaux:
Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process. Microelectron. Reliab. 53(9-11): 1659-1662 (2013) - 2012
- [j15]Nuria Torres Matabosch, Mehmet Kaynak, Fabio Coccetti, Matthias Wietstruck, Bernd Tillack, Jean Louis Cazaux:
Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS. Microelectron. Reliab. 52(9-10): 2310-2313 (2012) - [j14]Jinyu Jason Ruan, Nicolas Monnereau, David Trémouilles
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. IEEE Trans. Instrum. Meas. 61(2): 456-461 (2012) - [c2]Mihai Alexandru, Thierry Monteil, Fabio Coccetti, Hervé Aubert
Large electromagnetic problem on large scale parallel computing systems. HPCS 2012: 527-533 - 2011
- [j13]Usama Zaghloul, George J. Papaioannou
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. Microelectron. Reliab. 51(9-11): 1810-1818 (2011) - [j12]Usama Zaghloul, George J. Papaioannou, Bharat Bhushan
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. Microelectron. Reliab. 51(12): 2416 (2011) - 2010
- [j11]Usama Zaghloul, Matroni Koutsoureli, H. Wang, Fabio Coccetti, George J. Papaioannou
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectron. Reliab. 50(9-11): 1615-1620 (2010) - [j10]Mohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève:
Life expectancy and characterization of capacitive RF MEMS switches. Microelectron. Reliab. 50(9-11): 1692-1696 (2010)
2000 – 2009
- 2009
- [j9]Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou
Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectron. Reliab. 49(9-11): 1256-1259 (2009) - [j8]Mohamed Matmat, Fabio Coccetti, Antoine Marty, Robert Plana
Capacitive RF MEMS analytical predictive reliability and lifetime characterization. Microelectron. Reliab. 49(9-11): 1304-1308 (2009) - [j7]Usama Zaghloul, George J. Papaioannou
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. Microelectron. Reliab. 49(9-11): 1309-1314 (2009) - [j6]Joo-Young Choi, Jinyu Jason Ruan, Fabio Coccetti, Stepan Lucyszyn:
Three-Dimensional RF MEMS Switch for Power Applications. IEEE Trans. Ind. Electron. 56(4): 1031-1039 (2009) - [c1]Rémi Sharrock
Deployment and management of large planar reflectarray antennas simulation on grid. CLADE@HPDC 2009: 17-26 - 2008
- [j5]Jinyu Jason Ruan, George J. Papaioannou
ESD failure signature in capacitive RF MEMS switches. Microelectron. Reliab. 48(8-9): 1237-1240 (2008) - [j4]Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons
Alpha particle radiation effects in RF MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1241-1244 (2008) - [j3]Mohamed Lamhamdi, Patrick Pons
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectron. Reliab. 48(8-9): 1248-1252 (2008) - 2007
- [j2]Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana
Electrostatic discharge failure analysis of capacitive RF MEMS switches. Microelectron. Reliab. 47(9-11): 1818-1822 (2007) - 2005
- [j1]M. A. Exarchos, V. Theonas, Patrick Pons
Investigation of charging mechanisms in metal-insulator-metal structures. Microelectron. Reliab. 45(9-11): 1782-1785 (2005)
Coauthor Index
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