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Isaac Bruce

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2020 – today

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2024
[j3]
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Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen:
A BIST Approach to Approximate Co-Testing of Embedded Data Converters. IEEE Des. Test 41(3): 21-28 (2024)
[c13]
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  - conf/isvlsi/OkoOdionBDSC24
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Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen:
Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm. ISVLSI 2024: 27-32
[c12]
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Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Matthew Crabb, Degang Chen:
A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities. ISVLSI 2024: 708-711
[c11]
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  - conf/mwscas/BruceDOC024
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Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen:
Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm. MWSCAS 2024: 571-575
[c10]
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  - conf/mwscas/KarimpourBSYD024
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Saeid Karimpour, Isaac Bruce, Michael Sekyere, Ruohan Yang, Emmanuel Nti Darko, Degang Chen:
A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs. MWSCAS 2024: 1051-1055
2023
[j2]
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  - journals/et/BruceFCSRC23
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Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. J. Electron. Test. 39(1): 57-69 (2023)
[c9]
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Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen:
Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm. MWSCAS 2023: 477-481
[c8]
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Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen:
Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm. MWSCAS 2023: 604-608
2022
[j1]
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  - journals/et/FarayolaBCSRC22
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Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. J. Electron. Test. 38(6): 637-651 (2022)
[c7]
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Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. DFT 2022: 1-6
[c6]
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  - conf/ets/SteenhoekFBCSRC22
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Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Graph Theory Approach for Multi-site ATE Board Parameter Extraction. ETS 2022: 1-2
[c5]
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  - conf/itc/FarayolaBCS0022
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Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. ITC 2022: 509-513
[c4]
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  - conf/vts/FarayolaBCSRC22
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Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. VTS 2022: 1-7
2021
[c3]
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  - conf/dtis/FarayolaBCSRC21
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Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS 2021: 1-6
[c2]
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  - conf/ets/BruceFCOS0C21
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Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. ETS 2021: 1-4
[c1]
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Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. ITC 2021: 304-308

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