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Weidong Zhang 0002
Person information
- affiliation: Liverpool John Moores University, UK
Other persons with the same name
- Weidong Zhang (aka: Wei-Dong Zhang, Wei Dong Zhang) — disambiguation page
- Weidong Zhang 0001 — National Institutes of Health, Bethesda, MD, USA
- Weidong Zhang 0003
— Second Military Medical University, School of Pharmacy, Shanghai, China
- Weidong Zhang 0004
- Weidong Zhang 0005
- Weidong Zhang 0006 — Netease Games AI Lab, HangZhou, China
- Weidong Zhang 0007
- Weidong Zhang 0008
- Weidong Zhang 0009
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2020 – today
- 2023
- [j9]James Brown
A Pragmatic Model to Predict Future Device Aging. IEEE Access 11: 127725-127736 (2023) - [c9]Zheng Chai, Weidong Zhang
Stochastic Computing Based on Volatile Ovonic Threshold Switching Devices. ASICON 2023: 1-4 - [c8]Kean Hong Tok, Jian Fu Zhang, James Brown, Zhigang Ji, Weidong Zhang
Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps. ASICON 2023: 1-4 - 2022
- [j8]Yan Du, Wei Shao
Synaptic 1/f noise injection for overfitting suppression in hardware neural networks. Neuromorph. Comput. Eng. 2(3): 34006 (2022) - 2021
- [j7]Mehzabeen Mehedi, Kean Hong Tok, Zengliang Ye
On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude. IEEE Access 9: 43551-43561 (2021) - [c7]Zheng Chai, Pedro Freitas, Weidong Zhang
True random number generator based on switching probability of volatile GeXSe1-X ovonic threshold switching selectors. ASICON 2021: 1-4 - [c6]Mehzabeen Mehedi, Kean Hong Tok, Jian Fu Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang
An integrated method for extracting the statistical distribution of RTN time constants. ASICON 2021: 1-4 - 2020
- [j6]Mehzabeen Mehedi, Kean Hong Tok, Jianfu Zhang
An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants. IEEE Access 8: 182273-182282 (2020)
2010 – 2019
- 2019
- [c5]Jianfu Zhang, Azrif Manut
An assessment of RTN-induced threshold voltage jitter. ASICON 2019: 1-4 - [c4]Jian Fu Zhang, Zhigang Ji, Meng Duan, Wei Dong Zhang
Voltage step stress: a technique for reducing test time of device ageing. ICICDT 2019: 1-4 - [i1]Dovydas Joksas, Pedro Freitas, Zheng Chai, Wing H. Ng, Mark Buckwell, Weidong Zhang, Anthony J. Kenyon, Adnan Mehonic:
Committee Machines - A Universal Method to Deal with Non-Idealities in RRAM-Based Neural Networks. CoRR abs/1909.06658 (2019) - 2018
- [j5]Steven J. Duffy
Strain-Reduction Induced Rise in Channel Temperature at Ohmic Contacts of GaN HEMTs. IEEE Access 6: 42721-42728 (2018) - [j4]Jianfu Zhang
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction. Microelectron. Reliab. 80: 109-123 (2018) - 2017
- [j3]Khaled Ahmeda
Role of Self-Heating and Polarization in AlGaN/GaN-Based Heterostructures. IEEE Access 5: 20946-20952 (2017) - [c3]Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang
Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. ASICON 2017: 670-673 - 2015
- [c2]Jianfu Zhang
NBTI prediction and its induced time dependent variation. ASICON 2015: 1-4 - [c1]Zhigang Ji, Dimitri Linten, Roman Boschke, Geert Hellings, S. H. Chen, AliReza Alian, D. Zhou, Yves Mols, Tsvetan Ivanov, Jacopo Franco, Ben Kaczer, X. Zhang, R. Gao, Jianfu Zhang
ESD characterization of planar InGaAs devices. IRPS 2015: 3 - 2014
- [j2]Baojun Tang, Weidong Zhang
Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations. Microelectron. Reliab. 54(9-10): 2258-2261 (2014) - [j1]Sharifah Wan Muhamad Hatta, Zhigang Ji, Jianfu Zhang
Energy distribution of positive charges in high-k dielectric. Microelectron. Reliab. 54(9-10): 2329-2333 (2014)
Coauthor Index
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