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Seunghwan Song
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2020 – today
- 2024
- [j4]Dae-Jung Ahn, Changdong Jun, Seunghwan Song, Jun-Geol Baek:
Production System Maturity Model (PSMM) for Assessing Manufacturing Execution System. IEEE Access 12: 123459-123475 (2024) - [j3]Yeong-Min Kim, Seunghwan Song, Byoung-Mo Koo, Jeena Son, Yeseul Lee, Jun-Geol Baek:
Enhancing Long-Term Cloud Workload Forecasting Framework: Anomaly Handling and Ensemble Learning in Multivariate Time Series. IEEE Trans. Cloud Comput. 12(2): 789-799 (2024) - [c7]Jeena Son, Seunghwan Song, Jun-Geol Baek:
Patch-Based Time-Series Anomaly Detection with Cross-Variable Attention. ICAIIC 2024: 638-643 - 2023
- [c6]Seunghwan Song, Jun-Geol Back:
Representation Learning for Wafer Pattern Recognition in Semiconductor Manufacturing Process. ICAIIC 2023: 264-269 - [c5]Jueun Kim, Seunghwan Song, Woo Young Hwang, Jun-Geol Baek:
Interaction-based Fault Detection and Classification Using Randomly Masked 1D Convolutional Neural Network. ICAIIC 2023: 479-482 - [c4]Jiwon Moon, Seunghwan Song, Jun-Geol Baek:
Multivariate Time Series Anomaly Detection via Temporal Encoder with Normalizing Flow. ICAIIC 2023: 620-624 - 2022
- [c3]Seunghwan Song, Jun-Geol Baek:
Defect Information Synthesis via Latent Mapping Adversarial Networks. ICAIIC 2022: 17-22 - 2021
- [j2]Seunghwan Song, Bosung Jeon, Sungmin Hwang, Myung-Hyun Baek, Jong-Ho Lee, Byung-Gook Park:
Integrate-and-Fire Neuron Circuit With Synaptic Off-Current Blocking Operation. IEEE Access 9: 127841-127851 (2021) - 2020
- [c2]Seunghwan Song, Jun-Geol Baek:
New Anomaly Detection in Semiconductor Manufacturing Process using Oversampling Method. ICAART (2) 2020: 926-932
2010 – 2019
- 2018
- [j1]Chulbum Kim, Doo-Hyun Kim, Woopyo Jeong, Hyun-Jin Kim, Il-Han Park, Hyun Wook Park, Jong-Hoon Lee, Jiyoon Park, Yang-Lo Ahn, Ji Young Lee, Seungbum Kim, Hyun-Jun Yoon, Jaedoeg Yu, Nayoung Choi, Nahyun Kim, Hwajun Jang, Jonghoon Park, Seunghwan Song, Yongha Park, Jinbae Bang, Sanggi Hong, Youngdon Choi, Moosung Kim, Hyunggon Kim, Pansuk Kwak, Jeong-Don Ihm, Dae-Seok Byeon, Jin-Yub Lee, Ki-Tae Park, Kyehyun Kyung:
A 512-Gb 3-b/Cell 64-Stacked WL 3-D-NAND Flash Memory. IEEE J. Solid State Circuits 53(1): 124-133 (2018) - 2017
- [c1]Chulbum Kim, Ji-Ho Cho, Woopyo Jeong, Il-Han Park, Hyun Wook Park, Doo-Hyun Kim, Daewoon Kang, Sunghoon Lee, Ji-Sang Lee, Wontae Kim, Jiyoon Park, Yang-Lo Ahn, Jiyoung Lee, Jong-Hoon Lee, Seungbum Kim, Hyun-Jun Yoon, Jaedoeg Yu, Nayoung Choi, Yelim Kwon, Nahyun Kim, Hwajun Jang, Jonghoon Park, Seunghwan Song, Yongha Park, Jinbae Bang, Sangki Hong, Byunghoon Jeong, Hyun-Jin Kim, Chunan Lee, Young-Sun Min, Inryul Lee, In-Mo Kim, Sunghoon Kim, Dongkyu Yoon, Ki-Sung Kim, Youngdon Choi, Moosung Kim, Hyunggon Kim, Pansuk Kwak, Jeong-Don Ihm, Dae-Seok Byeon, Jin-Yub Lee, Ki-Tae Park, Kyehyun Kyung:
11.4 A 512Gb 3b/cell 64-stacked WL 3D V-NAND flash memory. ISSCC 2017: 202-203
Coauthor Index
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last updated on 2024-09-21 23:42 CEST by the dblp team
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