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Miji Lee
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2020 – today
- 2020
- [c5]Tae-Young Jeong, Miji Lee, Yunkyung Jo, Jinwoo Kim, Min Kim, Myungsoo Yeo, Jinseok Kim, Hyunjun Choi, Joosung Kim, Yoojin Jo, Yongsung Ji, Taiki Uemura, Hai Jiang, Dongkyun Kwon, HwaSung Rhee, Sangwoo Pae, Brandon Lee:
Reliability on EUV Interconnect Technology for 7nm and beyond. IRPS 2020: 1-4
2010 – 2019
- 2019
- [j2]U. Jin Baek, Miji Lee, Jongtae Lee
:
A Study on Linguistic Management in Online and Offline Communities: Focusing on the Effect of Jargons on the Conflict. Int. J. Asian Bus. Inf. Manag. 10(2): 111-125 (2019) - 2018
- [c4]Younggeun Ji, Jeonghoon Kim, Jungin Kim, Miji Lee, Jaeheon Noh, Taeyoung Jeong, Juhyeon Shin, Junho Kim, Young Heo, Ung Cho, Hyun-Chul Sagong, Junekyun Park, Yeonsik Choo, Gilhwan Do, Hoyoung Kang, Eunkyeong Choi, Dongyoon Sun, Changki Kang, Sangchul Shin, Sangwoo Pae:
Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI. IRPS 2018: 3 - 2017
- [j1]Taehoon Ko
, Je Hyuk Lee, Hyunchang Cho, Sungzoon Cho, Wounjoo Lee, Miji Lee:
Machine learning-based anomaly detection via integration of manufacturing, inspection and after-sales service data. Ind. Manag. Data Syst. 117(5): 927-945 (2017) - 2015
- [c3]Jongwoo Park, Miji Lee, Hanbyul Kang, Wooram Ko, Eunkyeong Choi, Junsik Im, Minwoo Lee, Dohwan Chung, Jinchul Park, Sangchul Shin, Sangwoo Pae:
Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism. IRPS 2015: 2 - [c2]Jongwoo Park, Jungpyo Hong, Miji Lee, Dongyoon Sun, Kyung Kang, Taesung Kim, Seungwon Kim, Sujin Kwon, Changkyu Joo, Sangsu Ha, Wooyeon Kim, Jongsu Ryu, Sangwoo Pae:
Contact resistance of solder bump with low cost photosensitive polyimide for high performance SoC. IRPS 2015: 3 - [c1]Jongwoo Park, Miji Lee, Kyunghwan Min, J.-K. Choi, Changkyu Joo, S.-C. Park, Hanbyul Kang, Sangwoo Pae:
Reliability of fine pitch COF: Influence of surface morphology and CuSn intermetallic compound formation. IRPS 2015: 4
Coauthor Index
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