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M. Liehr

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2015
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Brian L. Ji, H. Li, Q. Ye, S. Gausepohl, S. Deora, Dmitry Veksler, S. Vivekanand, H. Chong, H. Stamper, T. Burroughs, C. Johnson, M. Smalley, S. Bennett, V. Kaushik, J. Piccirillo, M. Rodgers, M. Passaro, M. Liehr:
In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory. CoRR abs/1509.00070 (2015)

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