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Marko S. Andjelkovic
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2020 – today
- 2024
- [j12]Rizwan Tariq Syed
, Yanhua Zhao
FPGA Implementation of a Fault-Tolerant Fused and Branched CNN Accelerator With Reconfigurable Capabilities. IEEE Access 12: 57847-57862 (2024) - [j11]Ladan Khaloopour, Yanpeng Su, Florian Raskob, Tobias Meuser, Roland Bless, Leon Janzen, Kamyar Abedi, Marko S. Andjelkovic, Hekma Chaari, Pousali Chakraborty, Michael Kreutzer, Matthias Hollick, Thorsten Strufe, Norman Franchi, Vahid Jamali:
Resilience-by-Design in 6G Networks: Literature Review and Novel Enabling Concepts. IEEE Access 12: 155666-155695 (2024) - [c32]Marko S. Andjelkovic, Nebojsa Maletic, Nicola Miglioranza, Milos Krstic, Enrico Koeck, Jan Buchholz, Maike Taddiken, Markus Fehrenz, Shaden Baradie, Dirk Wübben, Markus Breitbach:
6G-TakeOff: Holistic 3D Networks for 6G Wireless Communications. DSD 2024: 435-442 - [c31]Marko S. Andjelkovic, Milos Krstic:
A Holistic Approach for Characterization of SET Effects in a Standard Digital Cell Library. LASCAS 2024: 1-5 - [c30]Marko S. Andjelkovic, Milos Krstic:
Simulation-Based Analysis and Modeling of Generated Single Event Transient Pulse Width. LATS 2024: 1-6 - [c29]Junchao Chen, Li Lu, Marko S. Andjelkovic, Fabian Luis Vargas, Milos Krstic:
Space Radiation Flux Driven Fault Injection for Evaluating Dynamic Mitigation Strategies. LATS 2024: 1-6 - [c28]Rizwan Tariq Syed, Fabian Vargas, Marko S. Andjelkovic, Markus Ulbricht, Milos Krstic:
Aging and Soft Error Resilience in Reconfigurable CNN Accelerators Employing a Multi-Purpose On-Chip Sensor. LATS 2024: 1-6 - [c27]Fabian Vargas, Milos Krstic, Marko S. Andjelkovic, Markus Ulbricht, Junchao Chen:
Silicon Lifecycle Management Based on On-Chip Cross-Layer Sensing and Analytics for Space Applications. LATS 2024: 1-6 - [i3]Ladan Khaloopour, Yanpeng Su, Florian Raskob, Tobias Meuser, Roland Bless, Leon Würsching, Kamyar Abedi, Marko S. Andjelkovic, Hekma Chaari, Pousali Chakraborty, Michael Kreutzer, Matthias Hollick, Thorsten Strufe, Norman Franchi, Vahid Jamali:
Resilience-by-Design Concepts for 6G Communication Networks. CoRR abs/2405.17480 (2024) - 2023
- [j10]Rizwan Tariq Syed
Towards Reconfigurable CNN Accelerator for FPGA Implementation. IEEE Trans. Circuits Syst. II Express Briefs 70(3): 1249-1253 (2023) - [c26]Marko S. Andjelkovic, Oliver Schrape, Anselm Breitenreiter
SET and SEU Hardened Clock Gating Cell. DCIS 2023: 1-6 - [c25]Junchao Chen, Marko S. Andjelkovic, Milos Krstic
A Machine Learning-driven EDAC Method for Space-Application Memory. DFT 2023: 1-6 - [c24]Christos Georgakidis, Dimitris Valiantzas, Stavros Simoglou, Iordanis Lilitsis, Nikolaos Chatzivangelis
Towards a Comprehensive SET Analysis Flow for VLSI Circuits using Static Timing Analysis. DFT 2023: 1-6 - [c23]Marko S. Andjelkovic, Junchao Chen, Rizwan Tariq Syed, Fabian Vargas, Markus Ulbricht, Milos Krstic, Stefan D. Ilic, Milos Marjanovic, Sandra Veljkovic
Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System. DSD 2023: 286-293 - [c22]Junchao Chen, Li Lu, Marko S. Andjelkovic, Markus Ulbricht, Milos Krstic
Adaptive Lock-Step System for Resilient Multiprocessing Architectures. NorCAS 2023: 1-6 - 2022
- [b1]Marko S. Andjelkovic:
A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells (Eine Methode zur Charakterisierung, Modellierung und Minderung von SET Effekten in kombinierten CMOS-Standardzellen). University of Potsdam, Germany, 2022 - [j9]Anselm Breitenreiter
Fast Error Propagation Probability Estimates by Answer Set Programming and Approximate Model Counting. IEEE Access 10: 51814-51825 (2022) - [j8]Sandra Veljkovic
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress. J. Circuits Syst. Comput. 31(18): 2240003:1-2240003:25 (2022) - [j7]Marko S. Andjelkovic
Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors. J. Circuits Syst. Comput. 31(18): 2240007:1-2240007:24 (2022) - [j6]Marko S. Andjelkovic
A design concept for radiation hardened RADFET readout system for space applications. Microprocess. Microsystems 90: 104486 (2022) - [j5]Junchao Chen
Solar Particle Event and Single Event Upset Prediction from SRAM-Based Monitor and Supervised Machine Learning. IEEE Trans. Emerg. Top. Comput. 10(2): 564-580 (2022) - 2021
- [j4]Oliver Schrape
Design and Evaluation of Radiation-Hardened Standard Cell Flip-Flops. IEEE Trans. Circuits Syst. I Regul. Pap. 68(11): 4796-4809 (2021) - [c21]Marko S. Andjelkovic
A Tunable Single Event Transient Filter Based on Digitally Controlled Capacitive Delay Cells. DFT 2021: 1-6 - [c20]Anselm Breitenreiter
Reliability Analysis in Less than 200 Lines of Code. LASCAS 2021: 1-4 - [i2]Marko S. Andjelkovic, Junchao Chen, Aleksandar Simevski, Oliver Schrape, Milos Krstic, Rolf Kraemer:
Monitoring of Particle Flux and LET Variations with Pulse Stretching Inverters. CoRR abs/2104.01202 (2021) - [i1]Marko S. Andjelkovic, Junchao Chen, Aleksandar Simevski, Zoran Stamenkovic, Milos Krstic, Rolf Kraemer:
A Review of Particle Detectors for Space-Borne Self-Adaptive Fault-Tolerant Systems. CoRR abs/2104.01206 (2021) - 2020
- [j3]Yuanqing Li, Anselm Breitenreiter
Double cell upsets mitigation through triple modular redundancy. Microelectron. J. 96: 104683 (2020) - [c19]Junchao Chen, Thomas Lange, Marko S. Andjelkovic, Aleksandar Simevski, Milos Krstic
Hardware Accelerator Design with Supervised Machine Learning for Solar Particle Event Prediction. DFT 2020: 1-6 - [c18]Marko S. Andjelkovic
Design of Radiation Hardened RADFET Readout System for Space Applications. DSD 2020: 484-488 - [c17]Oliver Schrape, Marko S. Andjelkovic
Design Concept for Radiation-Hardening of Triple Modular Redundancy TSPC Flip-Flops. DSD 2020: 616-621 - [c16]Marko S. Andjelkovic
A Review of Particle Detectors for Space-Borne Self-Adaptive Fault-Tolerant Systems. EWDTS 2020: 1-8 - [c15]Marko S. Andjelkovic
Characterization of Single Event Transient Effects in Standard Delay Cells. ICECS 2020: 1-4 - [c14]Aleksandar Simevski, Oliver Schrape, Carlos Benito
PISA: Power-robust Multiprocessor Design for Space Applications. IOLTS 2020: 1-6
2010 – 2019
- 2019
- [c13]Junchao Chen, Marko S. Andjelkovic
Design of SRAM-Based Low-Cost SEU Monitor for Self-Adaptive Multiprocessing Systems. DSD 2019: 514-521 - [c12]Marko S. Andjelkovic
A Particle Detector Based on Pulse Stretching Inverter Chain. ICECS 2019: 594-597 - [c11]Marko S. Andjelkovic
Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells. IOLTS 2019: 212-215 - 2018
- [j2]Marko S. Andjelkovic
Study of the operation and SET robustness of a CMOS pulse stretching circuit. Microelectron. Reliab. 82: 100-112 (2018) - [c10]Yuanqing Li, Anselm Breitenreiter
Flip-Flop SEUs Mitigation through Partial Hardening of Internal Latch and Adjustment of Clock Duty Cycle. DDECS 2018: 9-14 - [c9]Oliver Schrape, Anselm Breitenreiter
D-SET Mitigation Using Common Clock Tree Insertion Techniques for Triple-Clock TMR Flip-Flop. DSD 2018: 201-205 - [c8]Marko S. Andjelkovic
Impact of Resistive Open and Bridge Defects on the SET Robustness of Standard CMOS Combinational Logic. EWDTS 2018: 1-6 - [c7]Marko S. Andjelkovic
Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates. ICECS 2018: 361-364 - 2017
- [c6]Marko S. Andjelkovic
A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study. ATS 2017: 82-87 - [c5]Marko S. Andjelkovic
An analysis of the operation and SET robustness of a CMOS pulse stretching circuit. DDECS 2017: 61-66 - [c4]Marko S. Andjelkovic
Design of an On-chip System for the SET Pulse Width Measurement. DSD 2017: 111-118 - [c3]Marko S. Andjelkovic
Assessment of the amplitude-duration criterion for SET/SEU robustness evaluation. IOLTS 2017: 9-12 - 2016
- [c2]Marko S. Andjelkovic
SET response of a SEL protection switch for 130 and 250 nm CMOS technologies. IOLTS 2016: 185-190 - 2015
- [j1]Marko S. Andjelkovic
Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch. J. Electron. Test. 31(3): 275-289 (2015) - [c1]Marko S. Andjelkovic
Simulation-Based Analysis of the Single Event Transient Response of a Single Event Latchup Protection Switch. DDECS 2015: 255-258
Coauthor Index
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