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David Wei Zhang
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2020 – today
- 2023
- [j12]Kun Chen, Jingwen Yang, Chunlei Wu, Chen Wang, Min Xu, David Wei Zhang:
Strained Si Nanosheet pFET Based on SiC Strain Relaxed Buffer Layer for High Performance and Low Power Logic Applications. IEEE Access 11: 65491-65495 (2023) - [j11]Taoyi Zhou, David Wei Zhang:
A Low Cost Self-Adaptive Screening Method Based on Automatic Test Equipment for Low Dropout Voltage Regulators in Mass Production. IEEE Access 11: 73403-73413 (2023) - [j10]Xiaona Zhu, Rongzheng Ding, Ouwen Tao, Yage Zhao, Peishun Tang, David Wei Zhang, Ye Lu, Shaofeng Yu:
A Combined N/PFET CFET-Based Design and Logic Technology Framework for CMOS Applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(12): 4999-5005 (2023) - [j9]Heng Xu, Jun Wang, Hang Xu, Yi Gu, Hao Zhu, Qing-Qing Sun, David Wei Zhang:
Impact Study of Layout-Dependent Effects Toward FinFET Combinational Standard Cell Optimization. IEEE Trans. Circuits Syst. II Express Briefs 70(2): 731-735 (2023) - 2022
- [j8]Fengwei Dai, David Wei Zhang, Yangyang Yan, Guojun Wang, Liqiang Cao:
Research on Ni3Sn4 intermetallic compound for 5μm diameter Cu/Ni/Sn-3.0Ag micro bumps. IEICE Electron. Express 19(2): 20210453 (2022) - [j7]Jian Jin, Mengyuan Sun, Yannan Yang, Min Xu, David Wei Zhang:
A high-speed low side GaN e-HEMT driver with gate ringing and overshoot suppression. IEICE Electron. Express 19(10): 20220144 (2022) - [j6]Jun Wang, Haozhou Zhu, Yang Yu, Xu Liu, Eryuan Feng, Chuanzhen Lei, Yanfei Cai, Hao Zhu, Qing-Qing Sun, David Wei Zhang:
A Transistor-Level DFF Based on FinFET Technology for Low Power Integrated Circuits. IEEE Trans. Circuits Syst. II Express Briefs 69(2): 584-588 (2022) - [c14]Yuqing Fang, Qingxuan Li, Tianyu Wang, Jialin Meng, Qing-Qing Sun, David Wei Zhang, Lin Chen:
Photon-Memristive Device for Neuromorphic Computing. ICTA 2022: 50-51 - 2021
- [c13]Tiantian Pi, Dongqi Xiao, Hui Yang, Xiaohan Wu, Wenjun Liu, Shi-Jin Ding, David Wei Zhang:
Fabrication of high-performance a-IGZO thin-film transistor with post-annealing treatment. ASICON 2021: 1-2 - [c12]Dawei Wang, Tao Liu, Xin Sun, Kun Chen, Jingwen Yang, Chunlei Wu, Min Xu, David Wei Zhang:
Channel Stress Engineering Through Source/Drain Recess Optimization and Its Process Variation Study for 5 nm-node FinFETs. ASICON 2021: 1-4 - [c11]Hang Xu, Dong-Hui Zhao, Hao Zhu, Qing-Qing Sun, David Wei Zhang:
A process optimization method for carrier stored trench bipolar transistor (CSTBT) device. ASICON 2021: 1-4 - 2020
- [j5]Shuiyuan Wang, Xiaozhang Chen, Xiaohe Huang, David Wei Zhang, Peng Zhou:
Neuromorphic Engineering for Hardware Computational Acceleration and Biomimetic Perception Motion Integration. Adv. Intell. Syst. 2(11): 2000124 (2020)
2010 – 2019
- 2019
- [j4]Yi Hu, Jiali Hou, Jianyun Zhang, David Wei Zhang, Yang He:
An ultra-low power robust CMOS temperature sensor with an inaccuracy of ±0.7°C from -40°C to 85°C. IEICE Electron. Express 16(16): 20190381 (2019) - [c10]Xiaozhi Kang, Xiaoxu Kang, Zijian Zhao, Jingxiu Ding, Yi Hu, Dapeng Xu, Qingqing Sun, David Wei Zhang:
Low-Dropout Regulator design with a simple structure for good high frequency PSRR performance based on Bandgap Circuit. ASICON 2019: 1-4 - [c9]Lei Liu, Yao Yao, Meng-Qi Wen, Yue Li, David Wei Zhang:
A pn-Coupled Superjunction IGBT for High Switching Speed. ASICON 2019: 1-4 - 2018
- [c8]Jianguo Yang, Xing Li, Tao Wang, Xiaoyong Xue, Zhiliang Hong, Yuanyuan Wang, David Wei Zhang, Hongliang Lu:
A Physically Unclonable Function with BER < 0.35% for Secure Chip Authentication Using Write Speed Variation of RRAM. ESSDERC 2018: 54-57 - 2017
- [c7]Liang Zheng, Lin-Jie Yu, Lin Chen, Qing-Qing Sun, Wei Huang, Hao Zhu, David Wei Zhang:
Vertical power diodes based on bulk GaN substrates. ASICON 2017: 163-166 - [c6]Tian-Yu Wang, Lin-Jie Yu, Lin Chen, Hao Liu, Hao Zhu, Qing-Qing Sun, Shi-Jin Ding, Peng Zhou, David Wei Zhang:
Atomic layer deposited Hf0.5Zr0.5O2-based flexible RRAM. ASICON 2017: 203-206 - [c5]Lin-Jie Yu, Tian-Yu Wang, Lin Chen, Hao Zhu, Qing-Qing Sun, Shi-Jin Ding, Peng Zhou, David Wei Zhang:
Graphite planar resistive switching memory and its application in pattern recognition. ASICON 2017: 343-346 - [c4]Zhongxun Guo, Wu Zan, Peng Zhou, Wenzhong Bao, David Wei Zhang:
A new device architecture based on two dimensional van der Waals heterostructures. ASICON 2017: 674-677 - 2015
- [j3]Xinyan Liu, Jun Wu, Xiaoyong Liu, Shuai Zhang, Xi Lin, Chun-Min Zhang, Peng-Fei Wang, David Wei Zhang:
Characterization and Optimization of a Single-Transistor Active Pixel Image Sensor with Floating Junction Connected to Floating Gate. J. Sensors 2015: 167145:1-167145:11 (2015) - [j2]Xiangming Xu, Jingfeng Huang, Han Yu, Biao Ma, Peng-Fei Wang, David Wei Zhang:
Elimination of stress induced dislocation in deep Poly Sinker LDMOS technology. Microelectron. Reliab. 55(3-4): 486-491 (2015) - [j1]Po Li, Yung-Cheng Wang, Jing-Wei Peng, David Wei Zhang:
Impact of substrate resistance and layout on passivation etch-induced wafer arcing and reliability. Microelectron. Reliab. 55(6): 931-936 (2015) - [c3]Lihui Wang, Qing Li, Gang Zhang, Jun Yu, Zhimin Zhang, Limin Guo, David Wei Zhang:
A New SPA Attack on ECC with Regular Point Multiplication. CIS 2015: 322-325 - 2013
- [c2]Zhaoyang Pi, Lun Zhu, Jingwei Zhang, Dongping Wu, David Wei Zhang, Zhi-Bin Zhang, Shi-Li Zhang:
Ultra-low frequency P(VDF-TrFE) piezoelectric energy harvester on flexible substrate. ASICON 2013: 1-4 - [c1]Chun-Min Zhang, Qing-Qing Sun, Peng-Fei Wang, David Wei Zhang:
PEALD Ru/RuOx films for ULSI applications and its transition control between metal and metal oxide. ASICON 2013: 1-4
Coauthor Index
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